Silicon Drift Detector (SDD) – Combined Sources Sought/Notice of Intent to Sole Source

Background
The National Institute of Standards and Technology (NIST) is seeking information from sources capable of providing a Silicon Drift Detector (SDD). If no alternate sources are identified, NIST intends to issue a Sole Source Award to AMPTEK, INC.

The SDD is required for the Physical Measurements Laboratory (PML) Quantum Measurement Division (QMD) to detect X-ray spectroscopy of light emitted by highly ionized atoms created inside an Electron Beam Ion Trap (EBIT). The SDD sensor must be UHV compatible for installation near the x-ray light source within the ultra-high vacuum chamber of the EBIT, which facilitates the study of x-ray spectra from highly ionized atoms.

Work Details
The Contractor shall provide one (1) Silicon Drift Detector (SDD) that meets the following minimum specifications:

1. Sensor type: silicon drift detector (SDD) with integrated pre-amplifier;
2. Sensor active area: 25 mm2;
3. Energy range of interest: from 0.3 keV to 10 keV, or wider;
4. Resolution: 125 eV FWHM or narrower with 4 micro-second peaking time at 210K (-63C);
5. The sensor shall be sealed with a light-tight window for operation under normal room lighting conditions with specified transmission efficiencies across various x-ray energy ranges;
6. The sensor and electrical connections must be compatible with ultra-high vacuum (UHV) conditions;
7. The sensor position must be adjustable with a travel range of 20 cm;
8. The vacuum interface must be a 2.75” Conflat flange;
9. The electrical power line must be compatible with regular North American 110V single-phase AC outlets;
10. Software to operate the detector and acquire data must be included or downloadable free of charge and compatible with Microsoft Windows.